X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 289 18% PEG 3350, 0.2 M MgCl2, 0.25% glucoside, 0.1 M HEPES, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 289K
Unit Cell:
a: 45.662 Å b: 87.642 Å c: 113.572 Å α: 69.32° β: 82.56° γ: 90.02°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.34 Solvent Content: 47.49
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.677 38.78 36855 1823 91.28 0.2483 0.2830 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.677 38.78 92.0 0.107 ? 13.8 6.0 45790 42123 -3 -3 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.677 2.79 92.5 ? ? 1.9 5.4 4241
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-BM 1.00000 APS 22-BM
Software
Software Name Purpose Version
SERGUI data collection .
PHENIX model building .
PHENIX refinement (phenix.refine: 1.8.2_1309)
HKL-2000 data reduction .
HKL-2000 data scaling .
PHENIX phasing .