ISDA: 4RHF

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	5.4	293	0.1 M tri-sodium citrate, pH 5.4, 0.5 M ammonium sulfate, 1.2 M lithium sulfate, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Unit Cell:

a: 97.600 Å b: 97.600 Å c: 97.600 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: P 2 3

Crystal Properties:

Matthew's Coefficient: 3.39 Solvent Content: 63.77

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	1.764	97.60	29186	1549	99.78	0.23759	0.25669	24.390

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.764	97.6	99.8	0.136	?	26.8	40.5	30802	30737	?	-3	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.764	1.86	100		?	13.7	39.9

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	PAL/PLS BEAMLINE 5C (4A)	0.97952	PAL/PLS	5C (4A)

Software