ISDA

4RHA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	7.5	293	2.5M Ammonium sulphate, 0.1M HEPES pH 7.5, 1.5% MPD, 20mM Magnesium acetate, EVAPORATION, temperature 293K

Unit Cell:

a: 58.627 Å b: 58.627 Å c: 72.746 Å α: 90.00° β: 90.00° γ: 120.00°

Symmetry:

Space Group: P 32

Crystal Properties:

Matthew's Coefficient: 2.30 Solvent Content: 46.59

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MAD	THROUGHOUT	1.7500	29.3100	26698	1421	99.6500	0.1681	0.1976	37.487

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.750	50.000	99.700	0.066	?	10.200	6.200	28244	28244	?	-3	30.7

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.750	1.780	100.000	?	?	3.2	5.500	1436

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 19-ID	0.97915, 0.97929	APS	19-ID

Software