X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.2 292 17% PEG2000 MME, 10% glycerol, 220 mM magnesium chloride, 100 mM potassium chloride, 100 mM MES-KOH, pH 6.2, 5% MPD, 6% Jeffamine M-600, 0.02% beta-DDM, 2 mM DTT, VAPOR DIFFUSION, HANGING DROP, temperature 292K
Unit Cell:
a: 65.910 Å b: 240.270 Å c: 152.700 Å α: 90.00° β: 102.28° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 3.81 Solvent Content: 67.69
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 3.408 49.903 31546 1623 49.94 0.2470 0.2882 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.408 55.0 50.2 ? ? 10.40 5.9 63228 31754 2.24 2.24 80.97
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.408 3.50 1.4 ? ? 2.24 5.7 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 1.000 SLS X06SA
Software
Software Name Purpose Version
XDS data scaling .
PHASER phasing .
PHENIX refinement (phenix.refine: 1.8.2_1309)
XDS data reduction .
Diffraction data scaling anisotropy server