X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.5 289 1.6M Ammonium Sulfate, 0.1M MES:NaOH, 10% (v/v) Dioxane, pH 4.5, VAPOR DIFFUSION, SITTING DROP, temperature 289K
Unit Cell:
a: 43.687 Å b: 43.687 Å c: 132.811 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 41 21 2
Crystal Properties:
Matthew's Coefficient: 2.17 Solvent Content: 43.43
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 1.571 36.497 18758 909 99.84 0.1574 0.1938 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.57 36.5 100.0 0.124 ? 47.2 14.0 18841 18841 0 -5 13.76
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.57 1.60 99.8 ? ? 3.9 7.9 891
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97915 APS 19-ID
Software
Software Name Purpose Version
SBC-Collect data collection .
SHELXD phasing Builder/HKL3000
MLPHARE phasing Builder/HKL3000
DM model building Builder/HKL3000
DENZO data reduction Builder/HKL3000
SCALEPACK data scaling Builder/HKL3000
PHENIX refinement (phenix.refine: 1.8.2_1309)
HKL-3000 data reduction .
HKL-3000 data scaling .
DM phasing Builder/HKL3000
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