X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 298 1.0M (NH4)2 SO4, 20 mM Tris HCl pH 8, 100 mM NaCl, 5% glycerol and 4 mM DTT, vapor diffusion, hanging drop, temperature 298K, VAPOR DIFFUSION, HANGING DROP
Unit Cell:
a: 144.870 Å b: 153.030 Å c: 132.840 Å α: 90.000° β: 111.970° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.91 Solvent Content: 57.70
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.4000 65.0000 102608 5118 98.0600 0.1938 0.2105 103.3600
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.400 65.0000 98.300 0.073 ? 9.170 ? ? 102609 ? -3.000 77.960
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.400 2.470 96.500 ? ? 2.070 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 1.03930 APS 24-ID-C
Software
Software Name Purpose Version
XSCALE data scaling .
BUSTER-TNT refinement .
PDB_EXTRACT data extraction 3.15
XDS data reduction .
PHASER phasing .
BUSTER refinement 2.10.0