X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 298 0.2M Potassium sulfate, 2.2M Ammonium sulfate, vapor diffusion, hanging drop, temperature 298K
Unit Cell:
a: 236.800 Å b: 236.800 Å c: 236.800 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: F 2 3
Crystal Properties:
Matthew's Coefficient: 3.77 Solvent Content: 67.35
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION FOURIER SYNTHESIS THROUGHOUT 3.1000 19.531 19473 1948 97.6300 0.1967 0.2183 95.3200
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.100 19.531 97.400 0.076 ? 11.610 ? 19474 19474 ? -3.000 135.220
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.100 3.180 98.800 ? ? 1.730 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 0.97950 APS 24-ID-C
Software
Software Name Purpose Version
XSCALE data scaling .
BUSTER-TNT refinement .
PDB_EXTRACT data extraction 3.15
BUSTER refinement 2.10.0
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