X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 298 0.1M MES sodium salt pH 6.5, 2.0M Ammonium sulfate, 5% w/v PEG 400, vapor diffusion, hanging drop, temperature 298K
Unit Cell:
a: 116.820 Å b: 116.820 Å c: 64.080 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 6 2 2
Crystal Properties:
Matthew's Coefficient: 2.02 Solvent Content: 39.19
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.3000 54.134 11771 1178 98.5800 0.2328 0.2679 80.2600
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.300 54.134 98.600 0.102 ? 15.560 ? 11772 11772 ? -3.000 50.920
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.300 2.360 94.200 ? ? 1.080 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 0.97920 APS 24-ID-C
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing 2.5.6
BUSTER-TNT refinement .
PDB_EXTRACT data extraction 3.15
BUSTER refinement 2.10.0