X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5 296 10% PEG 6000, 0.7 M lithium chloride, 0.2 M citric acid pH 5, VAPOR DIFFUSION, HANGING DROP, temperature 296K
Unit Cell:
a: 31.560 Å b: 37.530 Å c: 63.910 Å α: 85.45° β: 82.26° γ: 81.26°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.25 Solvent Content: 45.33
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD ? 1.700 31.607 29561 1502 93.73 0.1887 0.2126 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.7 37.03 93.7 ? 0.074 10.8 3.8 ? 29564 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.7 1.79 91.7 ? 0.424 2.8 3.8 4221
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X6A 1.000 NSLS X6A
Software
Software Name Purpose Version
HKL-2000 data collection .
SHELXCD phasing .
SHELXE model building .
PHENIX refinement (phenix.refine: 1.8.4_1496)
iMOSFLM data reduction .
SCALA data scaling .
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