4R5Q

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7 293 3.5M Sodium FORMATE, 0.1M BIS-TRIS PROPANE, pH 7, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 117.836 Å b: 117.836 Å c: 89.412 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: I 4 2 2
Crystal Properties:
Matthew's Coefficient: 3.10 Solvent Content: 60.32
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 2.65 37.26 9155 651 99.1 0.229 0.253 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.650 37.260 99.4 0.04700 ? 41.0000 10.400 ? 9378 ? 2.000 33.00
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID ? APS 19-ID
Software
Software Name Purpose Version
SBC-Collect data collection .
HKL-3000 phasing .
DM model building .
SHELX model building .
Coot model building .
PHENIX refinement (phenix.refine: 1.8.4_1496)
HKL-3000 data reduction .
HKL-3000 data scaling .
DM phasing .
SHELX phasing .