X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 298 50 mM TrisHCL buffer 7.5, 60% Tascimate 8.0, 1% Beta-octyl glucoside, 12% Glycerol, VAPOR DIFFUSION, SITTING DROP, temperature 298K
Unit Cell:
a: 107.160 Å b: 107.160 Å c: 61.610 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 4 21 2
Crystal Properties:
Matthew's Coefficient: 3.72 Solvent Content: 66.90
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 2.0400 47.9230 23379 1202 99.7800 0.2059 0.2424 23.9286
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.040 47.9230 99.900 0.198 ? 8.800 9.400 23421 23379 0 0 22.940
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.040 2.100 100.000 ? ? 2.300 9.000 1802
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X6A 1.07810 NSLS X6A
Software
Software Name Purpose Version
Aimless data scaling 0.1.26
PHENIX refinement 1.8.4_1496
PDB_EXTRACT data extraction 3.14
CBASS data collection .
MOSFLM data reduction .
MOLREP phasing .
Feedback Form
Name
Email
Institute
Feedback