X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 277 2.4 M ammonium dihydrogen phosphate, 0.1 M Tris, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 277K
Unit Cell:
a: 133.516 Å b: 133.516 Å c: 190.949 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 31 2 1
Crystal Properties:
Matthew's Coefficient: 3.89 Solvent Content: 68.38
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 3.392 28.757 26095 1268 93.82 0.2502 0.2991 164.45
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.389 30.0 94 ? ? ? 10.0 26177 26177 0 0 137.4
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.389 3.52 59.9 ? 0.494 1.9 5.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 190 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 0.9793 NSLS X29A
Software
Software Name Purpose Version
ADSC data collection Quantum
SOLVE phasing .
PHENIX refinement (phenix.refine: 1.9_1692)
HKL-2000 data reduction .
HKL-2000 data scaling .