X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.3 298 20% PEG3350 0.2M AMMONIUM TARTRATE DIBASIC,SODIUM AZIDE, PH 6.35, VAPOR DIFFUSION, SITTING DROP, TEMPERATURE 296K, temperature 298K
Unit Cell:
a: 210.940 Å b: 326.840 Å c: 77.210 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 21 21 2
Crystal Properties:
Matthew's Coefficient: 3.040 Solvent Content: 59.580
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION DIFFERENCE FOURIER THROUGHOUT 2.8000 32.2900 124907 6292 94.3600 0.1999 0.2328 80.5300
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.800 32.290 99.700 0.136 ? 7.100 6.320 132370 132035 0. 0.000 82.010
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.800 2.900 99.800 ? ? 1.500 4.150 13058
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 93.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-BM 1.0 APS 22-BM
Software
Software Name Purpose Version
d*TREK data reduction .
BUSTER-TNT refinement BUSTER 2.10.0
PDB_EXTRACT data extraction 3.14
SERGUI data collection .
d*TREK data scaling .
PHASER phasing .
BUSTER refinement 2.10.0