X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 293 5% glycerol 1mM 3MBPP1 5 mM TCEP 28% PEG2000 MME 0.1 M BisTris pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 70.289 Å b: 75.967 Å c: 92.688 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 1.99 Solvent Content: 38.23
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 2.7480 39.5630 13411 675 99.7500 0.2058 0.2655 58.3087
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.750 45.000 100.000 0.143 ? 5.300 7.500 13464 13454 0 0 55.870
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.750 2.800 100.000 ? ? 2.86 7.700 674
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 18-ID .97915 APS 18-ID
Software
Software Name Purpose Version
PHASER phasing 2.5.6
PHENIX refinement 1.9_1692
PDB_EXTRACT data extraction 3.14
HKL-3000 data collection .
DENZO data reduction .
SCALEPACK data scaling .
HKL-3000 data scaling .