X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 273 17% PEG3350, 0.2 M MgCl2, 0.1 M Tris, 5 % glycerol, 5 mM AMPPNP, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 273K
Unit Cell:
a: 56.203 Å b: 86.063 Å c: 82.066 Å α: 90.00° β: 97.34° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.40 Solvent Content: 48.85
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 2.257 43.032 34234 1736 98.42 0.2367 0.2851 32.3931
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.260 46.790 98.400 0.163 ? 7.000 4.100 36575 35990 -3 -3 23.860
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.260 2.330 93.900 ? ? 2.200 4.000 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID .979183 APS 19-ID
Software
Software Name Purpose Version
Aimless data scaling 0.2.17
PHENIX refinement 1.8.4_1496
PDB_EXTRACT data extraction 3.14
SBC-Collect data collection .
XSCALE data scaling .
PHASER phasing .