4QL5

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7 298 20% polyethylene glycol (PEG) 3350 (w/v), 0.05 M zinc acetate dihydrate, cryoprotectant paratone oil, pH 7, VAPOR DIFFUSION, SITTING DROP, temperature 298K
Unit Cell:
a: 83.636 Å b: 83.636 Å c: 50.575 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 41 21 2
Crystal Properties:
Matthew's Coefficient: 2.67 Solvent Content: 53.99
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.025 19.323 ? 1071 99.84 0.1895 0.2091 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.02 19.323 99.8 0.054 ? 19.4 8.1 ? 12161 0 -2 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.02 2.22 99.6 ? ? 3.4 7.3 2827
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-D 1.12720 APS 21-ID-D
Software
Software Name Purpose Version
HKL-3000 data collection .
PHENIX model building (phenix.autsol)
PHENIX refinement (phenix.refine: 1.9_1692)
XDS data reduction .
Aimless data scaling .
PHENIX phasing .