X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.9 294.0 0.2 M NH4NO3, 0.05 M Tris-HCl, 30% ploy(ethylene glycol) monomethyl ester 550, pH 7.9, VAPOR DIFFUSION, HANGING DROP, temperature 294.0K
Unit Cell:
a: 111.000 Å b: 111.000 Å c: 112.400 Å α: 112.30° β: 101.60° γ: 114.30°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.00 Solvent Content: 58.99
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.00 30.0 234028 11681 84.5 0.224 0.267 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.0 30.0 92.1 0.060 0.060 29.1 3.5 280610 258442 0 0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.00 2.07 74.2 ? 0.493 1.9 2.7 20834
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON CLSI BEAMLINE 08ID-1 0.98 CLSI 08ID-1
Software
Software Name Purpose Version
HKL-2000 data collection .
PHASES phasing .
CNS refinement .
HKL-2000 data reduction .
HKL-2000 data scaling .