X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.25 277.15 100 mM MES, 200 mM NaCl, 5% (v/v) PEG 3350, pH 6.25, VAPOR DIFFUSION, HANGING DROP, temperature 277.15K
Unit Cell:
a: 205.918 Å b: 89.869 Å c: 93.261 Å α: 90.00° β: 101.80° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 3.13 Solvent Content: 60.68
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.41 29.34 20962 1040 95.49 0.21502 0.27671 84.894
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.4 30 96.1 0.142 ? 7.695 3.0 27361 22003 -2000 -2 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.40 3.46 95.9 ? ? 2.05 2.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 110 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-D 0.979 APS 21-ID-D
Software
Software Name Purpose Version
HKL-2000 data collection .
REFMAC refinement 5.8.0049
DENZO data reduction .
HKL-2000 data scaling .
REFMAC phasing 5.8.0049