X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.0 277.15 100 mM BisTris, 200 mM NaCl, 5% PEG 3350, pH 6.0, VAPOR DIFFUSION, HANGING DROP, temperature 277.15K
Unit Cell:
a: 200.623 Å b: 88.761 Å c: 92.232 Å α: 90.00° β: 101.39° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.98 Solvent Content: 58.75
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.00 29.71 30373 1591 99.61 0.19741 0.24027 58.892
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.0 30.0 99.8 0.1 ? 14.26 5.1 31986 31965 -2000 -2 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.0 3.05 97.2 ? ? 1.93 3.9 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 110 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-F 0.978 APS 21-ID-F
Software
Software Name Purpose Version
HKL-2000 data collection .
REFMAC refinement 5.8.0049
DENZO data reduction .
SCALEPACK data scaling .
REFMAC phasing 5.8.0049