X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 293.15 0.19M ammonium acetate, 0.1M sodium acetate, 0.1% beta-mercaptoethanol, and 27% PEG 4000, pH 4.6, VAPOR DIFFUSION, HANGING DROP, temperature 293.15K
Unit Cell:
a: 36.627 Å b: 44.802 Å c: 85.895 Å α: 99.33° β: 103.04° γ: 91.79°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.00 Solvent Content: 38.62
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 1.900 35.594 35664 1991 86.44 0.1880 0.2358 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.90 50.00 87.5 ? 0.04 19.5 ? 70555 36096 2 2 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.90 1.97 47.3 ? 0.12 7.0 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.07426 APS 22-ID
Software
Software Name Purpose Version
SERGUI data collection .
PHENIX model building .
PHENIX refinement (phenix.refine: 1.8.1_1168)
HKL-2000 data reduction .
HKL-2000 data scaling .
PHENIX phasing .
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