X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 289 BrabA.17333.a.B1.PS02033 at 20 mg/mL against MCSG-1 screen condition F2 0.2 M ammonium acetate, 0.1 M BisTris HCl pH 6.5, 25% PEG 3350 supplemented with 25% ethylene glycol as cryo-protectant, crystal tracking ID 254589f2, unique puck ID xrf9-6, VAPOR DIFFUSION, SITTING DROP, temperature 289K
Unit Cell:
a: 47.690 Å b: 92.060 Å c: 86.410 Å α: 90.000° β: 96.820° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.26 Solvent Content: 45.66
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.7500 50.0000 74272 3688 99.4700 0.1574 0.1851 24.4560
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.750 50 99.500 0.072 ? 13.610 3.7 74703 74295 ? -3.000 25.269
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.750 1.800 99.000 ? ? 2.320 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL7-1 1.12709 SSRL BL7-1
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing 2.5.6
REFMAC refinement 5.8.0071
PDB_EXTRACT data extraction 3.14
XDS data reduction .