X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 291 Crystallization buffer was 0.1M Tris-HCl, pH 8.5, 3% (w/v) PEG8000, 6% (v/v) ethylene glycol , VAPOR DIFFUSION, SITTING DROP, temperature 291K
Unit Cell:
a: 92.764 Å b: 127.402 Å c: 96.640 Å α: 90.000° β: 100.890° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 3.58 Solvent Content: 65.69
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 2.7000 47.4490 118069 5949 98.9500 0.2302 0.2610 64.6000
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.700 47.987 100.000 ? 0.067 11.500 3.800 232284 60631 1.0 1.0 56.290
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.700 2.850 100.000 ? 0.695 1.100 3.800 8825
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON MAX II BEAMLINE I911-3 1.0010 MAX II I911-3
Software
Software Name Purpose Version
SCALA data scaling 3.3.20
MOLREP phasing 6.0
PHENIX refinement 1.8.3_1479
PDB_EXTRACT data extraction 3.14
MxCuBE data collection .
XDS data reduction .