4QCC

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.0 298 0.1 M MES, pH 6.0, 0.6 M ammonium sulfate, 1% PEG3350, VAPOR DIFFUSION, HANGING DROP, temperature 298K
Unit Cell:
a: 272.680 Å b: 272.680 Å c: 272.680 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: F 2 3
Crystal Properties:
Matthew's Coefficient: 6.76 Solvent Content: 81.81
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 7.078 96.407 2522 127 94.67 0.2843 0.3165 289.7980
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
7.078 96.407 94.7 0.073 ? 15.62 ? ? 2526 ? -3.0 320.857
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 7.078 7.260 95.1 ? ? 1.670 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU 1.542 ? ?
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing 2.5.6
REFMAC refinement 5.8.0069
PDB_EXTRACT data extraction 3.14