X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 290 PACT screen, F2: 200mM NaBr, 100mM BisTris propane, 20% PEG 3350; MytuD.18669.a.B1 at 20.2mg/ml, cryo 15% EG; tray 252936 f2, puck iqo4-7, VAPOR DIFFUSION, SITTING DROP, temperature 290K, pH 6.5
Unit Cell:
a: 131.620 Å b: 73.020 Å c: 82.470 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 2
Crystal Properties:
Matthew's Coefficient: 2.53 Solvent Content: 51.4
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 1.950 30.047 57529 2824 98.05 0.1833 0.2184 42.9130
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.950 50 98.100 0.065 ? 16.650 6.3 58701 57563 0 -3.000 27.830
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.95 2.00 100 ? ? 3.36 6.2 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-F 0.97872 APS 21-ID-F
Software
Software Name Purpose Version
XSCALE data scaling .
PHENIX refinement 1.9_1692
PDB_EXTRACT data extraction 3.14
XDS data reduction .
PHASER phasing .