X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 277 0.1 M Tris, 0.1 M CaCl2, 20% PEG6k, 15% ethylene glycol, VAPOR DIFFUSION, SITTING DROP, temperature 277K, pH 8.5
Unit Cell:
a: 74.324 Å b: 84.269 Å c: 219.724 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: I 2 2 2
Crystal Properties:
Matthew's Coefficient: 2.46 Solvent Content: 50.07
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.5000 29.4100 24293 1254 99.7700 0.2387 0.2681 45.1700
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.330 29.410 99.200 0.164 ? 8.600 6.100 29997 29757 0 0 49.190
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.330 2.410 93.500 ? ? 2.500 6.100 2729
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON DIAMOND BEAMLINE I02 .97949 Diamond I02
Software
Software Name Purpose Version
Aimless data scaling 0.2.17
PHASER phasing .
BUSTER-TNT refinement .
PDB_EXTRACT data extraction 3.14
XSCALE data scaling .
BUSTER refinement 2.10.0
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