X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 289 JCSG+(f12): 30% Jeffamine M-600, pH=7.0, 100mM HEPES free acid/ NaOH, VAPOR DIFFUSION, SITTING DROP, temperature 289K
Unit Cell:
a: 55.810 Å b: 324.160 Å c: 86.130 Å α: 90.00° β: 109.24° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.60 Solvent Content: 52.74
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.35 50.00 112574 5731 99.10 0.24273 0.25873 48.131
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.350 50.0 99.000 0.080 ? 13.280 3.7 119584 118369 0.0 -3.000 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.350 2.410 99.200 ? ? 2.400 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-F 0.97857 APS 21-ID-F
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing 2.5.6
REFMAC refinement 5.8.0069
PDB_EXTRACT data extraction 3.14