X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 293.15 40% (w/v) polyethylene glycol monomethyl ether 2,000 and 0.15 M KBr, pH 7.5, VAPOR DIFFUSION, temperature 293.15K
Unit Cell:
a: 57.267 Å b: 31.297 Å c: 50.899 Å α: 90.000° β: 112.180° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 1.54 Solvent Content: 20.13
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 1.2500 15.71 23290 2247 99.9000 0.1579 0.1893 17.7500
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.250 15.71 99.700 0.050 ? 19.300 7.2 23358 23296 ? -3.000 12.070
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.250 1.300 100.000 ? ? 3.250 6.97 2593
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-BM 1.0 APS 22-BM
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing 2.3.0
PHENIX refinement 1.8.3_1479
PDB_EXTRACT data extraction 3.14
SERGUI data collection .
XDS data reduction .