X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 9.0 298 125 mM cesium sulfate, 1.8 M ammonium sulfate, pH 9.0, vapor diffusion, hanging drop, temperature 298K
Unit Cell:
a: 235.340 Å b: 235.340 Å c: 235.340 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: F 2 3
Crystal Properties:
Matthew's Coefficient: 3.74 Solvent Content: 67.10
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.4000 83.2050 42120 4213 99.98 0.1972 0.2191 62.4900
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.400 83.205 99.995 0.075 ? 32.820 ? 42127 42125 ? -3.000 52.330
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.400 2.460 100.000 ? ? 4.240 ? 3092
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 0.9795 APS 24-ID-C
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing 2.5.5
PHENIX refinement dev_1555
PDB_EXTRACT data extraction 3.14
XDS data reduction .