4P7M

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 293 2 M ammonium sulphate, 0.1 M NaCl, 0.1 M Tris.HCl pH 8.0
Unit Cell:
a: 79.036 Å b: 79.750 Å c: 97.082 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: I 2 2 2
Crystal Properties:
Matthew's Coefficient: 2.01 Solvent Content: 38.90
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.0200 25.0200 6077 280 96.1600 0.2505 0.3243 48.2830
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.020 50.000 96.800 0.078 . 13.500 5.000 . 6087 . . .
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.020 3.070 98.700 . . . 5.100 312
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 93 K .
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU 1.5418 . .
Software
Software Name Purpose Version
HKL-2000 data collection .
HKL-2000 data reduction .
HKL-2000 data scaling .
REFMAC refinement 5.8.0049
PDB_EXTRACT data extraction 3.14
PHASER phasing .
DENZO data reduction .
SCALEPACK data scaling .