X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.0 292 100 MM BIS-TRIS, 24% PEG 3350, 5% JEFFAMINE 200 MM AMMONIUM ACETATE, 10 MM MGCL2, PH 6.0, VAPOR DIFFUSION
Unit Cell:
a: 128.367 Å b: 128.367 Å c: 284.460 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 32 2 1
Crystal Properties:
Matthew's Coefficient: 2.96 Solvent Content: 58.38
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.05 47.95 161800 8568 100.0 0.148 0.177 29.87
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.980 50.000 99.6 . 0.11800 6.6000 8.400 . 188039 . 1.360 .
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.98 2.01 91.2 . . . 7.30 .
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K .
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-D .97857 APS 21-ID-D
Software
Software Name Purpose Version
HKL-2000 data collection .
PHENIX refinement (PHENIX.REFINE: DEV_1186)
MOLREP phasing .
DENZO data reduction .
SCALEPACK data scaling .
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