X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 298 100 mM HEPES pH 8.0, 32% Jeffamine ED-2001 pH 7.0
Unit Cell:
a: 88.952 Å b: 97.150 Å c: 187.009 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: I 21 21 21
Crystal Properties:
Matthew's Coefficient: 3.55 Solvent Content: 65.39
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.2926 44.4760 36121 1838 98.3400 0.1734 0.2049 29.7500
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.200 50.000 100.000 0.167 . 5.600 7.400 . 41571 . . 26.380
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.200 2.240 100.000 . . . 7.300 2030
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K .
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X12C 0.9,1.1 NSLS X12C
Software
Software Name Purpose Version
HKL-2000 data collection .
HKL-2000 data scaling .
PHENIX refinement 1.7.2_869
PDB_EXTRACT data extraction 3.14
REFMAC refinement .
MOLREP phasing .
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