4OW3
X-RAY DIFFRACTION
Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
---|---|---|---|---|---|---|---|---|
1 | 298 K | . |
Source | Type | Wavelength List | Synchrotron Site | Beamline |
---|---|---|---|---|
FREE ELECTRON LASER | SLAC LCLS BEAMLINE CXI | 1.269, 1.297 | SLAC LCLS | CXI |
Software Name | Purpose | Version |
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