X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 295 50 mM MES pH6.5, 3.7-3.75% w/v PEG 20000, 5 mM YCl3, 200 mM NDSB 211, 2 mM TCEP pH7.5, VAPOR DIFFUSION, SITTING DROP, temperature 295K
Unit Cell:
a: 166.862 Å b: 186.739 Å c: 108.661 Å α: 90.00° β: 120.24° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 4.64 Solvent Content: 73.51
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.90 41.90 60890 3092 95.8 0.225 0.267 58.2
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.8 50 95 0.083 ? 18.1 2.9 67551 67551 0 0 40.8
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.8 2.85 87.1 ? ? 2.2 2.1 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E 1 APS 24-ID-E
Software
Software Name Purpose Version
ADSC data collection Quantum
CNS refinement .
HKL-2000 data reduction .
HKL-2000 data scaling .
CNS phasing .
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