X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 3.5 292 2 M Ammonium Sulfate, 0.1 M citric acid, pH 3.5, VAPOR DIFFUSION, HANGING DROP, temperature 292K
Unit Cell:
a: 45.480 Å b: 48.860 Å c: 51.050 Å α: 109.46° β: 106.84° γ: 109.00°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.63 Solvent Content: 53.29
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.00 18.86 16601 837 ? 0.2363 0.2830 49.51
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.00 50 75.7 0.078 ? 9.4 2.9 ? 16601 ? ? 22.13
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.15 2.21 8.4 ? ? 3.2 0.3 121
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E 0.97921 APS 24-ID-E
Software
Software Name Purpose Version
ADSC data collection Quantum
PHASER phasing .
BUSTER refinement 2.8.0
XDS data reduction .
XSCALE data scaling .
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