X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 296.15 100 mM Bis-Tris pH 6.5, 200 mM lithium sulfate, 25% PEG 3350, VAPOR DIFFUSION, HANGING DROP, temperature 296.15K
Unit Cell:
a: 82.434 Å b: 79.151 Å c: 103.449 Å α: 90.00° β: 98.04° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.25 Solvent Content: 45.25
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 2.000 31.506 87268 1639 97.92 0.1728 0.2169 30.9963
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.85 39.58 95.5 ? ? ? ? 340884 106662 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.85 1.95 80.1 ? 0.978 0.8 2.9 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL12-2 1.03 SSRL BL12-2
Software
Software Name Purpose Version
SCALA data scaling .
PHASER phasing 2.5.2
PHENIX refinement 1.8.1_1168
PDB_EXTRACT data extraction 3.14
XSCALE data scaling .