X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 298 0.1 M Trisodium citrate pH 5.5, 0.1 M MgCl2, 0.1 M NaCl and 12 % PEG 4,000, VAPOR DIFFUSION, HANGING DROP, temperature 298K
Unit Cell:
a: 232.360 Å b: 232.360 Å c: 143.570 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 32 2 1
Crystal Properties:
Matthew's Coefficient: 4.52 Solvent Content: 72.81
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 2.1700 29.7730 183387 10883 92.5800 0.1934 0.2155 41.1492
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.1700 30.000 99.300 0.178 ? 17.470 ? ? 183387 0.000 -3.000 39.937
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 1.00717 SLS X10SA
Software
Software Name Purpose Version
XSCALE data scaling .
PHENIX refinement 1.8.1_1168
PDB_EXTRACT data extraction 3.11
XDS data scaling .
XDS data reduction .
PHENIX phasing .