X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 277 0.2M Ammonium citrate, 20% PEG3350, pH 7.0 , VAPOR DIFFUSION, HANGING DROP, temperature 277K
Unit Cell:
a: 50.211 Å b: 60.475 Å c: 92.988 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.82 Solvent Content: 56.43
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.60 50.00 8661 435 99.17 0.21349 0.26373 56.179
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.60 50 99.1 0.087 0.087 25.0 3.9 9204 9204 0 -3 70.1
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.60 2.64 99.6 ? 0.634 2.4 4.0 475
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 0.97907 APS 22-ID
Software
Software Name Purpose Version
MAR345 data collection .
SERGUI data collection .
HKL-3000 phasing .
SHELXCD phasing .
SHELXE model building .
MLPHARE phasing .
DM model building .
RESOLVE model building .
ARP/wARP model building .
CCP4 model building .
REFMAC refinement 5.5.0109
HKL-2000 data reduction .
HKL-2000 data scaling .
DM phasing .
RESOLVE phasing .
CCP4 phasing .