X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 290 Rigaku Reagents, JCSG+ c5: 800mM KH2PO4, 800mm Na2HPO4, 100mM HEPES/NaOH pH 7.5; ButhA.17924.a.A1.PD0391 at 20.0mg/ml, tray 251248c5, puck iyg6-15, cryo: 25% EG in two steps, VAPOR DIFFUSION, SITTING DROP, temperature 290K
Unit Cell:
a: 95.940 Å b: 95.940 Å c: 109.200 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 43 21 2
Crystal Properties:
Matthew's Coefficient: 2.15 Solvent Content: 43
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.7000 50.0000 56234 2797 99.3600 0.1631 0.1864 29.2943
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.700 50 99.300 0.043 0.043 24.850 7.1 56674 56269 ? -3.000 30.600
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.700 1.740 97.800 ? ? 4.670 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.2 1.03320 ALS 5.0.2
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing 2.5.5
REFMAC refinement 5.8.0049
PDB_EXTRACT data extraction 3.14
BOS data collection .
XDS data reduction .
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