X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 273 0.17 M Sodium Acetate, 0.085 M Tris:HCl, 25.5% (w/v) PEG 4000, 15% (v/v) Glycerol, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 273K
Unit Cell:
a: 47.084 Å b: 48.965 Å c: 56.559 Å α: 109.85° β: 106.96° γ: 95.20°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.24 Solvent Content: 45.03
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.60 49.95 54113 2907 96.52 0.17713 0.19790 19.207
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.60 50.0 96.7 0.074 ? 18.5 3.9 58987 57020 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.60 1.63 90.3 ? ? 2.9 3.5 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 31-ID 0.9793 APS 31-ID
Software
Software Name Purpose Version
MOLREP phasing .
REFMAC refinement 5.8.0049
HKL-3000 data reduction .
HKL-3000 data scaling .