X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 293 1.6M ammonium sulfate, 100mM MES, 10% (v/V) dioxane, pH 6.5, vapor diffusion, temperature 293K
Unit Cell:
a: 34.378 Å b: 46.988 Å c: 100.902 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.16 Solvent Content: 43.15
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 0.8900 32.5410 120343 6000 95.6000 0.1245 0.1338 8.3304
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
0.890 100.902 95.800 ? 0.050 18.000 5.900 120441 120441 0 -3 7.040
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 0.890 0.940 87.200 ? 0.387 2.000 3.700 15730
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 17-ID 0.91840 APS 17-ID
Software
Software Name Purpose Version
SCALA data scaling 3.3.16
MOLREP phasing .
PHENIX refinement dev_730
PDB_EXTRACT data extraction 3.14
JDirector data collection .
XSCALE data scaling .
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