X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 298 14% (v/v) PEG550 MME, 0.1M HEPES pH 7.5, 0.2M LiSO4, Lipidic cubic phase (LCP), temperature 298K
Unit Cell:
a: 46.363 Å b: 91.148 Å c: 107.023 Å α: 90.00° β: 92.05° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.67 Solvent Content: 54.00
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 1.9010 46.33 137043 6810 99.3400 0.1995 0.2235 51.5654
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.900 46.33 97.100 0.071 ? 8.380 3.8 ? 133951 0 -3.000 36.100
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.900 2.020 97.100 ? ? 0.610 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 298 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E 1.0245 APS 24-ID-E
Software
Software Name Purpose Version
XSCALE data scaling .
PHENIX refinement dev_1558
PDB_EXTRACT data extraction 3.14
XDS data scaling .
XDS data reduction .
SHELXD phasing .
SHARP phasing .