X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 100 K |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| SYNCHROTRON | APS BEAMLINE 21-ID-D | 0.7686 | APS | 21-ID-D |
| Software Name | Purpose | Version |
|---|---|---|
| MD2 | data collection | diffractometer software from EMBL (with LS-CAT developed extensions |
| Single | model building | wavelength anomalous dispersion |
| SHELXL-97 | refinement | . |
| XDS | data reduction | . |
| XSCALE | data scaling | . |
| Single | phasing | wavelength anomalous dispersion |
