X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 298 70% MPD, 0.1M HEPES pH 7.5, vapor diffusion, hanging drop, temperature 298K
Unit Cell:
a: 73.720 Å b: 35.670 Å c: 66.290 Å α: 90.000° β: 100.310° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 1.85 Solvent Content: 33.34
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.9000 65.2200 3878 351 99.1100 0.2149 0.2609 64.6522
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.900 65.22 98.900 0.171 ? 7.990 6.1 3881 3881 ? -3.000 78.840
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.900 2.970 88.900 ? ? 1.790 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X8C 0.9789 NSLS X8C
Software
Software Name Purpose Version
XSCALE data scaling .
EPMR phasing 2.5
BUSTER-TNT refinement .
PDB_EXTRACT data extraction 3.14
BUSTER refinement 2.10.0
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