ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	5.50	289.0	VCID6271 PDE4 AT 7.9 MG/ML IN 20MM HEPES PH 7.5, 100 MM NACL, 1MM DTT, WITH 0.5MM T-028-1 (COMPOUND #7) AGAINST JCSG_B9 OPTIMIZATION SCREEN 0.1M SODIUM CITRATE TRIBASIC / CITRIC ACID, PH 5.5, 19.45% W/V PEG 6,000, CRYO 20% ETHYLENE GLYCOL AND 0.1MM T-028-1, CRYSTAL TRACKING ID 232699H5, VAPOR DIFFUSION, SITTING DROP, temperature 289.0K

Unit Cell:

a: 98.580 Å b: 98.580 Å c: 47.570 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: P 42

Crystal Properties:

Matthew's Coefficient: 2.70 Solvent Content: 54.43

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	2.15	49.29	25006	1274	?	0.158	0.207	28.71

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.150	49.29	99.3	0.09100	?	12.6800	4.0	25192	25012	0	-3.000	32.32

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.15	2.21	99.3	?	?	3.000	4.1	1848

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100.0 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 21-ID-D	1.07809	APS	21-ID-D

Software