X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 289 0.2M AMMONIUM CITRATE, 10% PEG3350, 6.0MM OCTYL BETA-THIOGLUCOPYRANOSIDE, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 289K
Unit Cell:
a: 42.460 Å b: 59.720 Å c: 168.950 Å α: 90.00° β: 91.40° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.48 Solvent Content: 50.45
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.20 29.85 39141 2059 95.2 0.214 0.266 56.373
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.200 29.850 96.9 0.08200 ? 21.3000 3.600 43164 41826 0 0.000 40.90
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.20 2.24 95.6 ? ? 3.960 3.20 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-5A 1.00000 Photon Factory BL-5A
Software
Software Name Purpose Version
ADSC data collection Quantum
SOLVE phasing .
RESOLVE model building .
OASIS model building .
REFMAC refinement 5.5.0088
HKL-2000 data reduction .
HKL-2000 data scaling .
RESOLVE phasing .
OASIS phasing .