X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.9 293 2.25 M LiCl, 0.1 M sodium acetate, 0.125 M NaCl, 2.5% glycerol, 25% ethylene glycol, pH 4.9, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 62.300 Å b: 62.300 Å c: 226.395 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 43
Crystal Properties:
Matthew's Coefficient: 3.21 Solvent Content: 61.66
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.1010 41.8920 48422 2468 96.8800 0.2019 0.2388 78.5058
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.100 50.000 97.000 0.067 ? 13.100 5.500 48539 48539 0.0 0.0 41.960
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.100 2.140 73.800 ? ? 1.46 3.200 1830
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 1.38592 APS 19-ID
Software
Software Name Purpose Version
DENZO data reduction .
SCALEPACK data scaling .
PHENIX refinement 1.8.4_1496
PDB_EXTRACT data extraction 3.11
HKL-3000 data collection .
HKL-3000 data reduction .
HKL-3000 data scaling .
MLPHARE phasing .