X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 289 MCSG1(d2): 0.2M NaCl, 0.1M Bis-Tris:HCl, pH=6.5, 25% PEG-3350, VAPOR DIFFUSION, SITTING DROP, temperature 289K
Unit Cell:
a: 121.190 Å b: 121.190 Å c: 64.140 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 4 21 2
Crystal Properties:
Matthew's Coefficient: 3.78 Solvent Content: 67.45
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.2200 85.6900 24096 1226 99.6100 0.1633 0.1951 33.583
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.220 99.6114 99.600 0.063 ? 32.670 9.0 24188 24096 0.0 -3.000 36.860
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.220 2.280 100.000 ? ? 5.700 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-F 0.97857 APS 21-ID-F
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing 2.5.5
REFMAC refinement .
PDB_EXTRACT data extraction 3.11
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