X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 9.5 277 0.2 M NaCl, 0.1 M CHES, 1.26 M (NH4)2SO4, pH 9.5, VAPOR DIFFUSION, SITTING DROP, temperature 277K
Unit Cell:
a: 104.148 Å b: 104.983 Å c: 123.247 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: I 2 2 2
Crystal Properties:
Matthew's Coefficient: 1.95 Solvent Content: 36.92
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.0100 29.0600 45109 1160 99.7800 0.1849 0.2272 39.4646
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.010 30.000 99.800 0.098 ? 18.0 5.800 45198 45121 ? -3 32.360
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.010 2.040 100.000 ? ? 1.72 4.900 2244
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-BM 0.97933 APS 19-BM
Software
Software Name Purpose Version
DENZO data reduction .
SCALEPACK data scaling .
BUSTER-TNT refinement BUSTER 2.10.0
PDB_EXTRACT data extraction 3.11
SBC-Collect data collection .
SHELX phasing .
MLPHARE phasing .
DM phasing .
BUCCANEER phasing .
Coot model building .
BUSTER refinement 2.10.0
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