X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 291.15 0.01 M cobalt (II) chloride hexahydrate, 0.1 M sodium acetate trihydrate, 1 M 1,6-Hexanediol, pH 4.6, VAPOR DIFFUSION, SITTING DROP, temperature 291.15K
Unit Cell:
a: 107.000 Å b: 107.000 Å c: 88.300 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 32 2 1
Crystal Properties:
Matthew's Coefficient: 2.23 Solvent Content: 44.75
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 1.600 41.027 77088 6002 99.97 0.1538 0.1760 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.6 41.05 100 0.146 ? 13.58 10 77116 77101 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.6 1.64 100 ? ? 2.35 9.95 5668
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 0.97795 SLS X06DA
Software
Software Name Purpose Version
XDS data scaling .
CCP4 model building .
PHENIX refinement (phenix.refine: 1.8.1_1168)
XDS data reduction .
CCP4 phasing .