X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7 289 JCSG+(g7): 01.M Succinic Acid, pH=7.0, 15% PEG-3350, VAPOR DIFFUSION, SITTING DROP, temperature 289K
Unit Cell:
a: 40.450 Å b: 64.070 Å c: 97.600 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.39 Solvent Content: 48.59
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.55 19.88 35577 1874 99.54 0.17326 0.19419 22.704
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.550 50.0 99.600 0.046 ? 22.710 6.0 37687 37518 0 -3.000 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.550 1.590 99.300 ? ? 3.510 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-F 0.9786 APS 21-ID-F
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing 2.5.2
REFMAC refinement .
PDB_EXTRACT data extraction 3.11
HKL-2000 data collection .
Feedback Form
Name
Email
Institute
Feedback